•
MS-Windows Version
system software,
friendly user interface
designed
•
ATPG automatic diital program generation Auto Learning
and Automatic Program Generation of Open/Short,
Pin Information, IC Clamping Diode,
TestJet™ Technology...
Automatic
Guarding points selection
Built in System Self-diagnostic function
Paperless repair system, real-time processmonitoring
& paperless repair station
Practical quality management and statistic
report available
BoardView function can allocate defect device
and pin instantly
2.
Advanced Testing Tecnologies Integration
In-Circuit Digital testing with Non-Multiplexing
Driver/Receiver
High fault coverage for Analog, Digital,
Mixed-Signal, and Memory Testing
The
best BGA testing solution with BoundaryScan
& Nand Tree
On-Board programming of Flash & EEPROM
memories
TestJet Technology, the best solution to
cover most SMT IC lead soldering defect
With IC Clamping Diode test technologies
can enhance the testing coverage of BGA
package
Alternative learning module can automatically
generate IC Reverse Check program
Test modules include, Frequency measurement, Voltage
measurement and Current measurement
Pin Contact Check capability
Multiple Safety Protection design for Press
Type
3.
Converting Tool Kit
Protect your investment in fixtures and
test programs
Improve your throughput
Increase your test coverage
Upgrade
your test capabilities
Save
your time and money
Changing
ATE venders can be no longer difficult
High accuracy wireless converting adapter
TRI provides three converting options a. Agilent to TRI adapter b. GenRad to TRI adapter c. Teradyne to TRI adapter
Intelligent
converting software, not only converting
but also improve the capabilities