Comprehenensive
features
# Add Functional Test with PXI Modules
# Cost Effective Digital 1:1 Driver/Receiver
per Pin Architecture Design
# Powerful Boundary Scan Test Solutions
# Easy to Use On Board Programming
Software
# Full Upgrade Options from MDA
to ICT and Functional Test
1. High Performance Manufactoring Defects Analiser
•
RCL
Measurement
•
HP
TestJet Technology, to find open connections to
surface- mount technology (SMT)
devices such as ICs and connectors
•
Intel®
Socket Test Technology, a superior test method
that can replace Intel CPU B-Scan and TestJet with
increased coverage.
•
Capacitor
Polarity Test
•
Transistor
/ Diode Measurement
2.
Full Digital In Circuit Test (ICT)
•
User
Friendly Interface: color syntax program editor,
C-like test language, Editable waveform display
tool, Integrated development environment.
•
Easy
to Use On Board Programming Software
•
Powerful
Boundary-Scan Cluster Test Capability
•
The
Most Cost-Effective Test Strategy
3.
Buit-In PXI Module Solution for Functional Test
4.
Auto-link software for ICT and AOI Optimization
